Performance of variable step-size dithered signed error CMA for blind equalization

Jusak, J, Hussain, Z and Harris, R 2004, 'Performance of variable step-size dithered signed error CMA for blind equalization', in E. Leelarasmee (ed.) IEEE TENCON 2004 - Analog and Digital Techniques in Electrical Engineering, Chiang Mai, Thailand, 21-24 November 2004, pp. 684-687.


Document type: Conference Paper
Collection: Conference Papers

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Title Performance of variable step-size dithered signed error CMA for blind equalization
Author(s) Jusak, J
Hussain, Z
Harris, R
Year 2004
Conference name IEEE TENCON Conference
Conference location Chiang Mai, Thailand
Conference dates 21-24 November 2004
Proceedings title IEEE TENCON 2004 - Analog and Digital Techniques in Electrical Engineering
Editor(s) E. Leelarasmee
Publisher IEEE
Place of publication Piscataway, USA
Start page 684
End page 687
Total pages 4
Abstract Recently a dithered signed-error constant modulus algorithm (DSE-CMA) has been proposed, associated with fractionally spaced equalization, for the purpose of low complexity implementation of constant modulus algorithm (CMA). DSE-CMA has robustness properties closely resembling those of CMA under certain restrictions. As the CMA is slow in achieving its minimum mean squared error, so is the DSE-CMA. In this work, we apply an adaptive step-size instead of a fixed one and then examine the performance of few variable step-size algorithms that result in faster convergence while preserve the low computational complexity and robustness properties of the DSE-CMA algorithm. We also derive the excess mean-squared error in the case of noisy channel to examine the robustness of the algorithms.
Subjects Broadband and Modem Technology
DOI - identifier 10.1109/TENCON.2004.1414688
Copyright notice © 2004 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
ISBN 0-7803-8560-8
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