A Radiation Hard LUT Block with Auto-Scrubbing

Haque, K and Beckett, P 2011, 'A Radiation Hard LUT Block with Auto-Scrubbing', in Apostolos Dollas, Manfred Glesner, (ed.) Proc 21st International Conference on Field Programmable Logic and Applications, Chania, Greece, 5-7 Sept. 2011, pp. 441-446.


Document type: Conference Paper
Collection: Conference Papers

Title A Radiation Hard LUT Block with Auto-Scrubbing
Author(s) Haque, K
Beckett, P
Year 2011
Conference name 21st International Conference on Field Programmable Logic and Applications
Conference location Chania, Greece
Conference dates 5-7 Sept. 2011
Proceedings title Proc 21st International Conference on Field Programmable Logic and Applications
Editor(s) Apostolos Dollas, Manfred Glesner,
Publisher IEEE
Place of publication Chania, Greece
Start page 441
End page 446
Total pages 6
Abstract We present a Silicon-on-Insulator based Look-up Table and configuration memory for application within a radiation hard reconfigurable system. The configuration storage includes a non-volatile EEPROM built using a standard single polysilicon Silicon on Insulator CMOS process linked to a Schmitt sense amplifier and transmission gate LUT structure. A simple current detector of the type used in conventional RAM circuits allows the configuration memory to be set up to exhibit self correcting, or "autoscrubbing" behavior. While the SOI EEPROM and Schmitt exhibit high intrinsic resistance to radiation induced errors, it is still possible for a sequence of two particle strikes to cause the configuration value to be lost. We undertake a preliminary analysis of the Single Event error Rate (SER) performance that results from this behavior.
Subjects Microelectronics and Integrated Circuits
Industrial Electronics
Keyword(s) SOI
Radiation hard
FPGA memory
Scrubbing
DOI - identifier 10.1109/FPL.2011.87
Copyright notice © 2011 IEEE
ISBN 9780769545295
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