Architectural test coverage for component-based integration testing

Hashim, N, Ramakrishnan, S and Schmidt, H 2007, 'Architectural test coverage for component-based integration testing', in Aditya Mathur, W. Eric Wong, M.F. Lau (ed.) Proceedings of Seventh International Conference on Quality Software (QSIC 2007), Portland, Oregon, USA, 11-12 October 2007, pp. 262-267.


Document type: Conference Paper
Collection: Conference Papers

Title Architectural test coverage for component-based integration testing
Author(s) Hashim, N
Ramakrishnan, S
Schmidt, H
Year 2007
Conference name Seventh International Conference on Quality Software (QSIC 2007)
Conference location Portland, Oregon, USA
Conference dates 11-12 October 2007
Proceedings title Proceedings of Seventh International Conference on Quality Software (QSIC 2007)
Editor(s) Aditya Mathur, W. Eric Wong, M.F. Lau
Publisher IEEE
Place of publication United States
Start page 262
End page 267
Total pages 6
Abstract This paper introduces a component-based integration testing method with an architectural test coverage criteria. This method is suitable for systems that lack system documentation and is applicable during regression testing and deployment phase. This paper also presents the initial results of an empirical study that validates the proposed test coverage criteria against an existing method in terms of the test coverage using a test suite precision parameter. We also describe the test models used that are based on probabilistic deterministic finite automata which are used to represent gate usage profiles at run-time and test execution. These models facilitate the representation and validation of the gate protocol, test coverage measurement and monitoring of the test suite coverage of each gate.
Subjects Software Engineering
Keyword(s) Automata
Automatic testing
Connectors
Documentation
Information technology
Monitoring
Performance evaluation
Software architecture
Software testing
System testing
DOI - identifier 10.1109/QSIC.2007.4385505
Copyright notice © 2007 IEEE
ISBN 9780769530352
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