Why area might reduce power in nanoscale CMOS

Beckett, P 2005, 'Why area might reduce power in nanoscale CMOS', in R. Ishii and L. Trajkoviæ (ed.) Proceedings of the IEEE International Symposium on Circuits and Systems, 2005 (ISCAS 2005), Kobe, Japan, 23-26 May 2005, pp. 2329-2332.


Document type: Conference Paper
Collection: Conference Papers

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Title Why area might reduce power in nanoscale CMOS
Author(s) Beckett, P
Year 2005
Conference name IEEE International Symposium on Circuits and Systems 2005 (ISCAS 2005)
Conference location Kobe, Japan
Conference dates 23-26 May 2005
Proceedings title Proceedings of the IEEE International Symposium on Circuits and Systems, 2005 (ISCAS 2005)
Editor(s) R. Ishii
L. Trajkoviæ
Publisher IEEE
Place of publication Piscataway, NJ
Start page 2329
End page 2332
Abstract In this paper we explore the relationship between power and area. By exploiting parallelism (and thus using more area) one can reduce the switching frequency allowing a reduction in VDD which results in a reduction in power. Under a scaling regime which allows threshold voltage to increase as VDD decreases we find that dynamic and subthreshold power loss in CMOS exhibit a dependence on area proportional to A(s-3)s/ while gate leakage power ? A(s-6)s/, and short circuit power ? A(s-8)s/. Thus, with the large number of devices at our disposal we can exploit techniques such as spatial computing, tailoring the program directly to the hardware, to overcome the negative effects of scaling. The value of s describes the effectiveness of the technique for a particular circuit and/or algorithm - for circuits that exhibit a value of s =3, power will be a constant or reducing function of area. We briefly speculate on how s might be influenced by a move to nanoscale technology.
Subjects Microelectronics and Integrated Circuits
Keyword(s) integrated circuits
power consumption
DOI - identifier 10.1109/ISCAS.2005.1465091
Copyright notice © 2005 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
ISBN 0780388348
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