The electromagnetic relay test system based on TMS320F28335

Wang, Y, Han, F, Xiang, W and Xu, G 2013, 'The electromagnetic relay test system based on TMS320F28335', in Dietmar Dietrich, Ren C. Luo, John Y . Hung (ed.) Proceedings of 39th Annual Conference of the IEEE Industrial-Electronics-Society (IECON), Vienna, Austria, 10-14 November 2013, pp. 1355-1358.


Document type: Conference Paper
Collection: Conference Papers

Title The electromagnetic relay test system based on TMS320F28335
Author(s) Wang, Y
Han, F
Xiang, W
Xu, G
Year 2013
Conference name 39th Annual Conference of the IEEE Industrial-Electronics-Society (IECON)
Conference location Vienna, Austria
Conference dates 10-14 November 2013
Proceedings title Proceedings of 39th Annual Conference of the IEEE Industrial-Electronics-Society (IECON)
Editor(s) Dietmar Dietrich, Ren C. Luo, John Y . Hung
Publisher IEEE
Place of publication Piscataway, USA
Start page 1355
End page 1358
Total pages 4
Abstract An electromagnetic relay test system is designed based on the 32-bit floating-point Microcontrollers (MCU): TMS320F28335. In the test system, the relay characteristic parameters, such as the coil resistance, pull-in voltage, release voltage and time parameters, can be tested by sampling of the relay coil current, electric shock voltage and drive supply voltage. The tested results can be displayed on the LCD and transmitted to PC. The sampling frequency of the system is 10 M Hertz, which is higher than the other relay test system. The whole system is portable and has low power consumption. Finally, the experimental results verify that the required parameters of the relay can be tested accurately using the designed system.
Subjects Automotive Mechatronics
Circuits and Systems
Keyword(s) TMS320F28335
relay characteristic parameters
coil resistance
release voltage
DOI - identifier 10.1109/IECON.2013.6699329
Copyright notice © 2013 IEEE
ISBN 9781479902248
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