Probing the Atomic Structures of Synthetic Monolayer and Bilayer Hexagonal Boron Nitride Using Electron Microscopy

Tay, R, Lin, J, Tsang, S, McCulloch, D and Teo, H 2016, 'Probing the Atomic Structures of Synthetic Monolayer and Bilayer Hexagonal Boron Nitride Using Electron Microscopy', Applied Microscopy, vol. 46, pp. 217-226.


Document type: Journal Article
Collection: Journal Articles

Title Probing the Atomic Structures of Synthetic Monolayer and Bilayer Hexagonal Boron Nitride Using Electron Microscopy
Author(s) Tay, R
Lin, J
Tsang, S
McCulloch, D
Teo, H
Year 2016
Journal name Applied Microscopy
Volume number 46
Start page 217
End page 226
Total pages 10
Publisher Korean Society of Microscopy
Abstract Monolayer hexagonal boron nitride (h-BN) is a phenomenal two-dimensional material; most of its physical properties rival those of graphene because of their structural similarities. This intriguing material has thus spurred scientists and researchers to develop novel synthetic methods to attain scalability for enabling its practical utilization. When probing the growth behaviors and structural characteristics of h-BN, the use of appropriate characterization techniques is important. In this review, we detail the use of scanning and transmission electron microscopies to investigate the atomic configurations of monolayer and bilayer h-BN grown via chemical vapor deposition. These advanced microscopy techniques have been demonstrated to provide intimate insights to the atomic structures of h-BN, which can be interpreted directly or indirectly using known growth mechanisms and existing theoretical calculations. This review provides a collective understanding of the structural characteristics and defects of synthetic h-BN films and facilitates a better perspective toward the development of new and improved synthesis techniques.
Subject Surfaces and Structural Properties of Condensed Matter
Keyword(s) Hexagonal boron nitride
Monolayer
Bilayer
Scanning electron microscopy
Transmission electron microscopy
DOI - identifier 10.9729/AM.2016.46.4.217
Copyright notice © 2016 Korean Society of Microscopy. This is an open-access article distributed under the terms of the Creative Commons Attribution Non-Commercial License (http://creativecommons.org/licenses/by-nc/4.0)
ISSN 2287-5123
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