Investigating ion release using inline ICP during in situ scratch testing of an Mg-Li(-Al-Y-Zr) alloy

Yan, Y, Zhou, P, Gharbi, O, Zeng, Z, Chen, X, Volovitch, P, Ogle, K and Birbilis, N 2019, 'Investigating ion release using inline ICP during in situ scratch testing of an Mg-Li(-Al-Y-Zr) alloy', Electrochemistry Communications, vol. 99, pp. 46-50.


Document type: Journal Article
Collection: Journal Articles

Title Investigating ion release using inline ICP during in situ scratch testing of an Mg-Li(-Al-Y-Zr) alloy
Author(s) Yan, Y
Zhou, P
Gharbi, O
Zeng, Z
Chen, X
Volovitch, P
Ogle, K
Birbilis, N
Year 2019
Journal name Electrochemistry Communications
Volume number 99
Start page 46
End page 50
Total pages 5
Publisher Elsevier
Abstract An electrochemical flow cell was constructed to permit the application of a mechanical scratch to the exposed material while monitoring the open circuit dissolution rates of the elemental alloy components. Elemental dissolution rates were determined where measured downstream using inductively coupled plasma atomic emission spectrometry (ICP-AES). The technique is demonstrated with Mg-Li(-Al-Y-Zr) alloy exposed to 0.01 M NaCl. A mechanical scratch was applied manually using a non-conductive and non-contaminating sapphire lancet without interrupting the on-line measurement. The ion dissolution rate from the newly exposed surface was significantly higher than the dissolution rate from the remaining surface area, corresponding to a high local current density. Notably, the increase in the dissolution rate from the scratched area occurred gradually after the scratch; then subsided within 200 s after the scratch, indicating that this particular Mg-alloy can repassivate by the formation of a surface film after a scratch was applied. This is the first reported use of an in situ scratch cell coupled with ICP-AES.
Subject Materials Engineering not elsewhere classified
Metals and Alloy Materials
Keyword(s) Electrochemistry
In situ
Magnesium
Magnesium‑lithium alloy
Online ICP
DOI - identifier 10.1016/j.elecom.2019.01.001
Copyright notice © 2019 The Author(s). Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license http://creativecommons.org/licenses/BY-NC-ND/4.0/)
ISSN 1388-2481
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