Unsupervised classification of single-particle X-ray diffraction snapshots by spectral clustering

Yoon, C, Schwander, P, Abergel, C, Martin, A., et al., and Inger, I 2011, 'Unsupervised classification of single-particle X-ray diffraction snapshots by spectral clustering', Optics Express, vol. 19, no. 17, pp. 16542-16549.


Document type: Journal Article
Collection: Journal Articles

Title Unsupervised classification of single-particle X-ray diffraction snapshots by spectral clustering
Author(s) Yoon, C
Schwander, P
Abergel, C
Martin, A., et al.,
Inger, I
Year 2011
Journal name Optics Express
Volume number 19
Issue number 17
Start page 16542
End page 16549
Total pages 8
Publisher Optical Society of America
Abstract Single-particle experiments using X-ray Free Electron Lasers produce more than 105 snapshots per hour, consisting of an admixture of blank shots (no particle intercepted), and exposures of one or more particles. Experimental data sets also often contain unintentional contamination with different species. We present an unsupervised method able to sort experimental snapshots without recourse to templates, specific noise models, or user-directed learning. The results show 90% agreement with manual classification.
Subject Condensed Matter Imaging
DOI - identifier 10.1364/OE.19.016542
Copyright notice © 2011 Optical Society of America.
ISSN 1094-4087
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