An investigation of the native oxide of aluminum alloy 7475-T7651 using XPS, AES, TEM, EELS, GDOES and RBS

Toh, S, McCulloch, D, Du Plessis, J, Paterson, P, Hughes, A, Jamieson, D, Rout, B, Long, J and Stonham, A 2003, 'An investigation of the native oxide of aluminum alloy 7475-T7651 using XPS, AES, TEM, EELS, GDOES and RBS', Surface Review and Letters, vol. 10, no. 2/3, pp. 365-371.


Document type: Journal Article
Collection: Journal Articles

Title An investigation of the native oxide of aluminum alloy 7475-T7651 using XPS, AES, TEM, EELS, GDOES and RBS
Author(s) Toh, S
McCulloch, D
Du Plessis, J
Paterson, P
Hughes, A
Jamieson, D
Rout, B
Long, J
Stonham, A
Year 2003
Journal name Surface Review and Letters
Volume number 10
Issue number 2/3
Start page 365
End page 371
Total pages 7
Publisher World Scientific Publishing
Abstract The native oxide on the rolled aerospace aluminum alloy 7475-T7651 was characterized using a variety of different techniques, including X-ray Photoelectron Spectrometry (XPS), Auger Electron Spectrometry (AES), Transmission Electron Microscopy (TEM), Electron Energy Loss Spectrometry (EELS), Glow Discharge Optical Emission Spectrometry (GDOES), and Rutherford Backscattered Spectrometry (RBS). All techniques revealed that the native oxide layer is magnesium-rich and is probably a mixture of magnesium and aluminum-magnesium oxides.1 The oxide layer was found to be of nonuniform thickness due to the rolling process involved during the manufacture of this sheet alloy; this complicates analysis using techniques which have poor spatial resolution. Direct thickness measurement from cross-sectional TEM reveals an oxide thickness which varies between 125 and 500 nm. This large variation in thickness was also evident from GDOES and AES depth profiles as well asthe RBS data. Both XPS and RBS also show evidence for the presence of heavy metals in the oxide.
Subject Physical Chemistry not elsewhere classified
DOI - identifier 10.1142/S0218625X0300530X
ISSN 0218-625X
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