Absence of morphotropic phase boundary effects in BiFeO(3)-PbTiO(3) thin films grown via a chemical multilayer deposition method

Gupta, S, Bhattacharjee, S, Pandey, D, Bansal, V, Bhargava, S, Peng, J and Garg, A 2011, 'Absence of morphotropic phase boundary effects in BiFeO(3)-PbTiO(3) thin films grown via a chemical multilayer deposition method', Applied Physics A-Materials Science & Processing, vol. 104, no. 1, pp. 395-400.


Document type: Journal Article
Collection: Journal Articles

Title Absence of morphotropic phase boundary effects in BiFeO(3)-PbTiO(3) thin films grown via a chemical multilayer deposition method
Author(s) Gupta, S
Bhattacharjee, S
Pandey, D
Bansal, V
Bhargava, S
Peng, J
Garg, A
Year 2011
Journal name Applied Physics A-Materials Science & Processing
Volume number 104
Issue number 1
Start page 395
End page 400
Total pages 6
Publisher Springer
Abstract We report an unusual behavior observed in (BiFeO3)1 -x-(PbTiO3)x (BF-xPT) thin films prepared using a multilayer chemical solution deposition method. Films of different compositions were grown by depositing several bilayers of BF and PT precursors of varying BF and PT layer thicknesses followed by heat treatment in air. X-ray diffraction showed that samples of all compositions show mixing of two compounds resulting in a single-phase mixture, also confirmed by transmission electron microscopy. In contrast to bulk compositions, samples show a monoclinic (MA-type) structure suggesting disappearance of the morphotropic phase boundary (MPB) at x = 0.30 as observed in the bulk. This is accompanied by the lack of any enhancement of the remanent polarization at the MPB, as shown by the ferroelectric measurements. Magnetic measurements showed an increase in the magnetization of the samples with increasing BF content. Significant magnetization in the samples indicates melting of spin spirals in the BF-xPT films, arising from a random distribution of iron atoms. Absence of Fe2+ ions was corroborated by X-ray photoelectron spectroscopy measurements. The results illustrate that thin film processing methodology significantly changes the structural evolution, in contrast to predictions from the equilibrium phase diagram, besides modifying the functional characteristics of the BP-xPT system dramatically.
Subject Nanomaterials
Keyword(s) Bi-layer
Bulk compositions
Chemical solution deposition method
Equilibrium phase diagrams
Ferroelectric measurements
DOI - identifier 10.1007/s00339-010-6163-5
Copyright notice © Springer-Verlag 2010
ISSN 0947-8396
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