Using NI LabVIEW and NI ELVIS for Ie parametric test in electronic test technology engineering education

Demidenko, S, Doung, M, Kuang, Y and Ooi, M 2012, 'Using NI LabVIEW and NI ELVIS for Ie parametric test in electronic test technology engineering education', in National Instruments ASEAN Graphical System Design Achievement Awards 2012, Singapore, 23 July 2012, pp. 184-189.


Document type: Conference Paper
Collection: Conference Papers

Title Using NI LabVIEW and NI ELVIS for Ie parametric test in electronic test technology engineering education
Author(s) Demidenko, S
Doung, M
Kuang, Y
Ooi, M
Year 2012
Conference name NI ASEAN 2012
Conference location Singapore
Conference dates 23 July 2012
Proceedings title National Instruments ASEAN Graphical System Design Achievement Awards 2012
Publisher National Instruments, ASEAN
Place of publication Singapore
Start page 184
End page 189
Total pages 6
Abstract Not available
Subjects Electrical and Electronic Engineering not elsewhere classified
Copyright notice © 2012 National Instruments Corporation. All rights reserved.
Versions
Version Filter Type
Access Statistics: 181 Abstract Views  -  Detailed Statistics
Created: Wed, 17 Jul 2013, 15:02:00 EST by Catalyst Administrator
© 2014 RMIT Research Repository • Powered by Fez SoftwareContact us