Application of a failure driven test profile in random testing

Chen, T, Kuo, F and Liu, H 2009, 'Application of a failure driven test profile in random testing', IEEE Transactions on Reliability, vol. 58, no. 1, pp. 179-192.


Document type: Journal Article
Collection: Journal Articles

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Title Application of a failure driven test profile in random testing
Author(s) Chen, T
Kuo, F
Liu, H
Year 2009
Journal name IEEE Transactions on Reliability
Volume number 58
Issue number 1
Start page 179
End page 192
Total pages 14
Publisher IEEE
Abstract Random testing techniques have been extensively used in reliability assessment, as well as in debug testing. When used to assess software reliability, random testing selects test cases based on an operational profile; while in the context of debug testing, random testing often uses a uniform distribution. However, generally neither an operational profile nor a uniform distribution is chosen from the perspective of maximizing the effectiveness of failure detection. Adaptive random testing has been proposed to enhance the failure detection capability of random testing by evenly spreading test cases over the whole input domain. In this paper, we propose a new test profile, which is different from both the uniform distribution, and operational profiles. The aim of the new test profile is to maximize the effectiveness of failure detection. We integrate this new test profile with some existing adaptive random testing algorithms, and develop a family of new random testing algorithms. These new algorithms not only distribute test cases more evenly, but also have better failure detection capabilities than the corresponding original adaptive random testing algorithms. As a consequence, they perform better than the pure random testing.
Subject Software Engineering
Keyword(s) Adaptive random testing
operational profile
random testing
test profile
uniform distribution
DOI - identifier 10.1109/TR.2008.2011687
Copyright notice © 2009 IEEE.
ISSN 0018-9529
Additional Notes © 2009 IEEE. Reprinted, with permission, from Chen, T, Kuo, F and Liu, H 2009, 'Application of a failure driven test profile in random testing', IEEE Transactions on Reliability, vol. 58, no. 1, pp. 179-192. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of RMIT University's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
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