A non-destructive method for thickness measurement of thin electrospun membranes using white light profilometry

Nor Affandi, N, Padhye, R, Arnold, L, Kyratzis, I and Truong, Y 2009, 'A non-destructive method for thickness measurement of thin electrospun membranes using white light profilometry', Journal of material science, vol. 45, pp. 1411-1418.


Document type: Journal Article
Collection: Journal Articles

Title A non-destructive method for thickness measurement of thin electrospun membranes using white light profilometry
Author(s) Nor Affandi, N
Padhye, R
Arnold, L
Kyratzis, I
Truong, Y
Year 2009
Journal name Journal of material science
Volume number 45
Start page 1411
End page 1418
Total pages 8
Publisher Springer Science
Abstract In recent years the electrospun nanofibre membranes have gained a great deal of attention due to their unique contribution to pore size, fine fibre diameter, light weight and larger surface to volume ratio compared to bulk fibres and film.
Subject Textile Technology
Keyword(s) electrospinning
nanofibres
nanofibre membranes
DOI - identifier 10.1007/s10853-009-4103-6
Copyright notice Springer Science+Business Media, LLC 2009
ISSN 1411-1418 00222461
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Created: Wed, 17 Nov 2010, 16:09:00 EST by Catalyst Administrator
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